雙面電池問題:
將電池的后側(cè)改為光蓋,被發(fā)現(xiàn)使雙面PERC電池和模塊對后側(cè)的新型PID敏感,即去極化型PID(PID-p)和腐蝕型PID機(jī)制(PID-c)。
解決方案:
為了測試電池的這些類型的PID,我們開發(fā)了PIDcon雙面體。它是用溫度、照明和高電壓對完整的電池進(jìn)行壓力測試,它可以在兩個(gè)方向上進(jìn)行極化。通過測量照明下的IV曲線,可以確定PID的靈敏度。
應(yīng)用:
太陽能電池片PID檢測
HIT、Topcon 、PERC、AL-BSF、PERC+、雙面PERC、PERT、PERL和IBC太陽能電池的研究、生產(chǎn)和質(zhì)量控制。
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PIDcon bifacial的特點(diǎn):
● 符合IEC62804-TS標(biāo)準(zhǔn)
● 易于使用的臺式設(shè)備
● 能夠測量c-Si太陽能電池和微型模塊
● 無需氣候室
● 無需層壓電池
● 測量速度:小時(shí)至數(shù)天
● 可測量參數(shù):分流電阻、功率損耗、電導(dǎo)率、漏電流、濕度、溫度
● 太陽能電池可以在以后通過EL等進(jìn)行研究
● 基于IP的系統(tǒng)允許遠(yuǎn)程操作和技術(shù)支持從世界任何地方
標(biāo)準(zhǔn)試驗(yàn)條件:
● 電壓:upto1.5kV
● 溫度:85°C
● 測試時(shí)間:4hours(typical)
● 干燥條件下,不需要水
類型 受壓 恢復(fù)
PID-s正面 85°C,+1.5 kV 85°C,-1.5 kV
PID-p背面 85°C,+1.5 kV,無照明 85°C, 暗儲存或光照
PID-c背面 85°C,+1.5 kV, 照明 不可恢復(fù)
層壓 150°C,20min
樣品尺寸 210×210mm
適用于 A PERC,AL-BSF,IBC,PERC+,雙面PERC,p型和n型電池 功率要求 110/230 V AC, 50/60 Hz
資質(zhì)認(rèn)證 根據(jù)ISO9001準(zhǔn)則制造,符合CE標(biāo)準(zhǔn)
參考文獻(xiàn): cells (1)K. Sporleder, V. Naumann, J. Bauer, S. Richter, A. H?hnel, S. Gro?er, M. Turek, C. Hagendorf, Local corrosion of silicon as root cause for potential induced degradation at the rear side of bifacial PERC solar cells. physica status solidi (RRL)–Rapid Research Letters. 2019, doi 10.1002/pssr.201900163
(2)V. Naumann, K. Ilse, M. Pander, J. Tr?ndle, K. Sporleder, C. Hagendorf, Influence of soiling and moisture ingress on long term PID susceptibility of photovoltaic
modules, AIP Conference Proceedings 2147, 090005 (2019).
(3)K. Sporleder, V. Naumann, J. Bauer, S. Richter, A. H?hnel, S. Gro?er, M. Turek, C. Hagendorf, Root cause analysis on corrosive potential-induced degradation effects at the rear side of bifacial silicon PERC solar cells, Solar Energy Materials and Solar Cells 201, 110062 (2019).
(4)K. Sporleder, V. Naumann, J. Bauer, S. Richter, A. H?hnel, S. Gro?er, M. Turek, C. Hagendorf, Microstructural Analysis of Local Silicon Corrosion of Bifacial Solar Cells
as Root Cause of Potential‐Induced Degradation at the Rear Side, Phys. Status Solidi A (2019), doi:10.1002/pssa.201900334.
(5)K. Sporleder, J. Bauer, S. Gro?er, S. Richter, A. H?hnel, M. Turek, V. Naumann, K. Ilse, C. Hagendorf, Potential-Induced Degradation of Bifacial PERC Solar Cells Under Illumination, IEEE Journal of Photovoltaics 9 (6) 1522-1525, 2019.
(6)K. Sporleder, M. Turek, N. Schüler, V. Naumann, D. Hevisov, C. P?blau, S. Gro?er, H. Schulte-Huxel, J. Bauer, C. Hagendorf, Quick test for reversible and irreversible PID of bifacial PERC solar cells, Solar Energy Materials and Solar Cells 219, 110755, 2021.
(7)K. Sporleder, V. Naumann, J. Bauer, D. Hevisov, M. Turek, and C. Hagendorf, Time-resolved Investigation of Transient Field Effect Passivation States during Potential Induced Degradation and Recovery of Bifacial Silicon Solar Cells , Solar RRL, 2021, accepted.
2010年*報(bào)道了晶硅太陽能組件在高壓影響下的故障。受影響的太陽能電池顯示分流電阻度降低。這種效應(yīng)被稱為電位誘導(dǎo)降解(PID)。
到目前為止,PID測試主要在模塊上進(jìn)行。模塊制造和氣候室測試需要大量的材料、設(shè)備和工作費(fèi)用。
PIDcon是與FraunhoferCSP合作開發(fā)的,目的是結(jié)合已建立的測試程序的優(yōu)點(diǎn):基于模塊的PID測試等現(xiàn)實(shí)的PID測試條件,以及較低的時(shí)間和成本支出。