公司介紹:
NTT-AT有著多年的X射線、極紫外光學(xué)配件的研發(fā)與銷售經(jīng)驗(yàn)。在范圍內(nèi),通過(guò)與眾多來(lái)自同步輻射科學(xué),阿秒科學(xué),高強(qiáng)度物理學(xué)等領(lǐng)域的科學(xué)研究者開展緊密合作,積累了大量*的設(shè)計(jì)與制造技術(shù),其產(chǎn)品在業(yè)內(nèi)享有很高的評(píng)價(jià)。NTT-AT提供的菲涅爾波帶片有著高分辨率,高聚光效率等特點(diǎn),適合被各種輻射光設(shè)施使用。另外,分辨率測(cè)試卡被當(dāng)作業(yè)界的標(biāo)準(zhǔn)。不只是學(xué)術(shù)研究,在X射線的檢查裝置開發(fā)現(xiàn)場(chǎng)也被廣泛使用。XUV鏡片,XUV濾波片不僅對(duì)阿秒科學(xué)有著幫助,對(duì)下一代的光刻研究也有這重要作用。NTT-AT將在XUV,EUV, X線領(lǐng)域給予客戶在研發(fā)上的幫助。
產(chǎn)品介紹:
No | Design name | AOI | pol. | peak energy | reflectivit | bandwidth (FWHM) | ||
1 | HR-98-3.4 | 5 deg | s | 98 eV | 12.7 nm | 67.7% | 3.4 eV | (0.4 nm) |
2 | HR-95-3.8 | 5 deg | s | 95 eV | 13.1 nm | 67.7% | 3.8 eV | (0.5 nm) |
3 | HR-90-3.8 | 5 deg | s | 90 eV | 13.8 nm | 68.0% | 3.8 eV | (0.6 nm) |
4 | HR-85-4.0 | 5 deg | s | 85 eV | 14.6 nm | 66.8% | 4.0 eV | (0.7 nm) |
5 | HR-80-4.0 | 5 deg | s | 80 eV | 15.5 nm | 63.3% | 4.0 eV | (0.8 nm) |
6 | HR-75-4.6 | 5 deg | s | 75 eV | 16.5 nm | 54.5% | 4.6 eV | (1.0 nm) |
7 | HR-70-5.0 | 5 deg | s | 70 eV | 17.7 nm | 47.5% | 5 eV | (1.2 nm) |
8 | HR-70-2.6 | 5 deg | s | 70 eV | 17.7 nm | 52.1% | 2.6 eV | (0.7 nm) |
9 | HR-65-2.6 | 5 deg | s | 65 eV | 19.1 nm | 48.5% | 2.6 eV | (0.8 nm) |
10 | HR-60-2.8 | 5 deg | s | 60 eV | 20.7 nm | 43.7% | 2.8 eV | (1.0 nm) |
11 | HR-55-3.6 | 5 deg | s | 55 eV | 22.5 nm | 37.3% | 3.6 eV | (1.5 nm) |
12 | HR-50-4.2 | 5 deg | s | 50 eV | 24.8 nm | 30.9% | 4.2 eV | (2.1 nm) |
13 | HR-48-2.0 | 5 deg | s | 48 eV | 25.8 nm | 50.6% | 2.0 eV | (1.1 nm) |
14 | HR-45-2.4 | 5 deg | s | 45 eV | 27.6 nm | 48.4% | 2.4 eV | (1.4 nm) |
15 | HR-40-2.6 | 5 deg | s | 40 eV | 31.0 nm | 44.8% | 2.6 eV | (2.0 nm) |
16 | HR-35-2.6 | 5 deg | s | 35 eV | 35.4 nm | 43.1% | 2.6 eV | (2.6 nm) |
17 | HR-30-3.0 | 5 deg | s | 30 eV | 41.3 nm | 41.2% | 3.0 eV | (4.1 nm) |
18 | HR45-90-6.0 | 45 deg | s | 90 eV | 13.1 nm | 66.1% | 6.0 eV | (0.9 nm) |
19 | HR45-80-7.4 | 45 deg | s | 80 eV | 15.5 nm | 60.0% | 7.4 eV | (1.4 nm) |
20 | HR45-70-36.0 | 45 deg | s | 70 eV | 17.7 nm | 49.0% | 3.6 eV | (0.9 nm) |
21 | HR45-60-5.4 | 45 deg | s | 60 eV | 20.7 nm | 40.8% | 5.4 eV | (1.8 nm) |
22 | HR45-50-10.0 | 45 deg | s | 50 eV | 24.8 nm | 30.0% | 10.0 eV | (5.1 nm) |
23 | HR45-40-5.0 | 45 deg | s | 40 eV | 31.0 nm | 44.4% | 5.0 eV | (3.8 nm) |
24 | HR45-30-7.0 | 45 deg | s | 30 eV | 41.3 nm | 42.5% | 7.0 eV | (9.3 nm) |
天文學(xué)
XUV光電子光譜
XUV顯微
EUV光刻
等離子體物理
阿秒科學(xué)